Case study: Combined MWIR Raman thermography for improved thermal control in semiconductor devices

Raman thermography uses the Raman spectrum from a semiconductor device to determine the local temperature with submicron lateral spatial resolution. Quantum Focus Instruments Corporation (QFI) coupled a Renishaw Virsa analyser to a QFI InfraScopeTM, an established mid-wave infrared (MWIR) temperature measurement microscope. This combined system is designed for the accurate determination of temperature in the layers of a device’s structure.

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Case study: Quality control of diamond-like carbon

New Plasma Technologies (NPT), based in Moscow, Russia, uses a Renishaw inVia confocal Raman microscope for investigating the structure and chemical properties of materials, non-destructively.

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Raman-SPM/AFM combined systems

Systémy AFM-Raman (SPM-Raman) společnosti Renishaw jsou ideálními nástroji pro nanotechnologický výzkum.

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Renishaw Raman system used with SEM to study fibres at UCLA

The University of California, Los Angeles (UCLA), USA, combines Raman microscopy with scanning electron microscopy (SEM) to study archaeological textiles and fibres. UCLA use a Renishaw SEM-SCA system to study textiles and fibres, non-destructively. The f

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inVia used to study graphene and other nano-materials at the University of Tokyo

The Mechanical Engineering Department of the University of Tokyo uses a Renishaw inVia confocal Raman microscope to study graphene and other nano-materials in the development of energy related devices such as solar cells.

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New low wavenumber performance

Study low wavenumber Raman features quickly and easily with Renishaw's Eclipse filters for the inVia Raman microscope; block the laser, not your Raman bands.

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